Abstract:The angle-dependent reflectance at the boundary between an isotropic and a uniaxial material has been fully analyzed, and as a consequence a new technique for complete characterization of the optical tensor of a uniaxial crystal has been developed and demonstrated. For the general uniaxial case, for both positive and negative uniaxial crystals both analytic formulation and numerical modeling show that if the TE-to-TM conversion reflectivity is measured then two sharp cusps appear at critical angles that correspond to the limits of generation of the ordinary and the extraordinary modes in the uniaxial crystal. (For the more conventional polarization-conserving reflectivity there is only one sharp critical edge, the second critical edge being rounded owing to polarization conversion.) It is also found that, for a general orientation of the uniaxial axis with respect to both the plane of incidence and the crystal surface, rotating the plane of incidence by 180-degrees results in a different polarization-conversion signal, thereby permitting a completely unambiguous determination of the Euler angles of the optical tensor. Based on the analytic and numerical modeling results, a novel and accurate optical technique, the polarization-conversion reflectivity technique, has been developed and used to characterize the optical tensor of a single crystal of calcite. The results show that, as well as an accurate optical-tensor characterization, a precise determination of the axis of symmetry of the crystal is simple without recourse to x-ray diffraction.

Critical Angles for Reflectivity at an Isotropic-anisotropic Boundary

Critical Edge Characterization of the Optical Tensor of a Uniaxial Crystal

Relations Between the Critical Angles and the Optical Tensor of a Biaxial Material.

The Goos-Hanchen Shift on the Surface of Uniaxially Anisotropic Left-Handed Materials

Effects of Surface Helical Conductances On Multiple Interactions of Composite Eccentrically Bianisotropic Cylinders: the Case of Tmz-Wave Incidence - Abstract

Boundary scattering effects on magnetotransport of narrow metallic wires and films

Multiple Scattering By an Array of Finite Cylindrically Curved Thin Screens

Inverse Transformation Optics and Reflection Analysis for Two-Dimensional Finite Embedded Coordinate Transformation

The Influence of Surface Reflectivities on Measurement of the Torsional Anchoring Strength of Nematic Liquid Crystals

Electromagnetic Wave Reflection From Boundaries Defined by General Linear and Local Conditions

A Simple Optical Procedure for Characterizing Uniaxial Media

Unique interface reflection phenomena tailored by nanoscale electromagnetic boundary conditions

Optical Characterization of A Uniaxial Material by the Polarization-Conversion Reflectivity Technique

Complex-angle analysis of electromagnetic waves on interfaces

Reflection/transmission Measurements of Anisotropic Films with One of the Principal Axes in the Direction of Columnar Growth

General Theory Of Optical Reflection From A Thin Film On A Solid And Its Application To Heteroepitaxy

Detecting and analysing wavelength-scale optical gradients at an interface by their effects on the internal reflectance near the critical angle

Optical reflection signature of an axion dielectric with magnetic current

Determination of Optical-Constants of Absorbing Crystalline Thin-Films from Reflectance and Transmittance Measurements with Oblique-Incidence

Brewster Angle for Anisotropic Materials from the Extinction Theorem

Consequences of the Fermat's anisotropic uniaxial principle on the reflexion and transmission factors for one-dimensional uniaxial crystal slabs