The application of ellipse-fitting in surface profile measurement

Yuan Bo,Zhang Zhuo,Liu Guodong,Pu Zhaobang
DOI: https://doi.org/10.3321/j.issn:0254-3087.2006.z1.015
2006-01-01
Abstract:This article studies different ellipse-fitting methods.In the view of fitting-quality,complexity of calculation and so on,it analyzes and compares these fitting methods.Then picks out the most favourite method-powerd new measurement method by using these methods to fit the ellipses in the images of the optic-probe surface profile measurement system.The results of experiments and emulations indicate that it is feasible to calculate the parameters of ellipse by using this ellipse-fitting method,it has good approaching effect and anti-noise capability.
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