Study on quantum and short-channel effects for sub-50nm FinFETs

WD Hu,XS Chen,ZJ Quan,XC Zhou,W Lu
DOI: https://doi.org/10.3321/j.issn:1001-9014.2006.02.003
2006-01-01
JOURNAL OF INFRARED AND MILLIMETER WAVES
Abstract:A new kind of sub-50 nm, N channel double gate MOS nanotransistors was simulated by solving coupling Poisson-Schrodinger equations in a self-consistent way with a finite element method, and a systematic simulation-based study was presented on the short-channel effects. Subthreshold swing, threshold-voltage roll-off, and drain-induced barrier lowering as well as the transconductance were investigated in terms of different dimensional parameters. The optimal Si-fin thickness (T-fin) and the gate length (L-g) were obtained. The simulation results were compared with the experimental results in order to verify the validity of the proposed quantum mechanical approach. In order to understand the influence of electron confinement, the result of quantum mechanical simulation were also compared with that of the classical approach. Our simulation results indicate that quantum mechanical simulation is essential for the realistic optimization of the FinFET structure.
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