Nanoscale Investigation of Moisture-Induced Degradation Mechanisms of Tris(8-Hydroxyquinoline) Aluminium-Based Organic Light-Emitting Diodes

MS Xu,JB Xu,HZ Chen,M Wang
DOI: https://doi.org/10.1088/0022-3727/37/18/019
2004-01-01
Abstract:By exploiting tapping mode atomic force microscopy, the moisture-induced degradation mechanisms of ITO (indium tin oxide)-coated glass/CuPc (copper phthalocyanine)/NPB (N, N'-di(naphthalene-1-yl)-N, N'-diphthalbenzidine)/Alq(3) (tris(S-hydroxyquinoline) aluminium)-based organic light-emitting diodes without cathode were investigated. It is found that three types of degradation mechanisms are associated with moisture-exposed Alq(3) films, when the device is exposed to moisture, namely, hydration of Alq(3), crystallization of Alq(3) and reaction of the Alq(3) complex with H2O. Crystallization of the NPB layer of ITO/CuPc/NPB was observed on exposure to moisture, and de-wetting simultaneously takes place at the interface of CuPc/NPB. Indium and/or oxygen may diffuse from ITO into the organic layers. These observations provide a clear picture of the moisture-induced degradation mechanisms of the ITO/CuPc/NPB/Alq(3)-based OLEDs.
What problem does this paper attempt to address?