Photodegradation of Organic Light-Emitting Devices Observed in Nitrogen-Filled Environment

X. Z. Wang,X. D. Gao,Yc. Zhou,Zt Xie,Q. L. Song,X. M. Ding,X. Y. Hou

DOI: https://doi.org/10.1016/j.tsf.2007.06.141

IF: 2.1

2007-01-01

Thin Solid Films

Abstract:Degradation of organic light-emitting devices (OLEDs) upon ultraviolet (UV) irradiation has been studied by measuring luminance–voltage (L–V) and current–voltage (I–V) characteristics of the devices in a nitrogen-filled glove-box. Photo-oxidation or reaction is no longer the main origin of the degradation for the devices protected by nitrogen. Conventional double-layer OLEDs with tris(8-hydroxyquinoline) aluminum (Alq3) as the electron transport material and single-layer devices containing Alq3 as the only organic material exhibit different degradation behaviors: both L–V and I–V characteristics degrade severely for the irradiated double-layer devices, whereas whether I–V degrades or not in a single-layer device is closely related to the species of the charge carriers flowing in the device. By comparing electroluminescent and photoluminescent degradation behaviors of the single-Alq3-layer devices, we conclude that lowered fluorescent quantum efficiency and hole current after UV irradiation are two origins of the degraded characteristics of the devices isolated from the moist environment.