Abstract:Quantum-dot light-emitting diodes promise a new generation of high-performance and solution-processed electroluminescent light sources. Understanding the operational degradation mechanisms of quantum-dot light-emitting diodes is crucial for their practical applications. Here, we show that quantum-dot light-emitting diodes may exhibit an anomalous degradation pattern characterized by a continuous increase in electroluminescent efficiency upon electrical stressing, which deviates from the typical decrease in electroluminescent efficiency observed in other light-emitting diodes. Various in-situ/operando characterizations were performed to investigate the evolutions of charge dynamics during the efficiency elevation, and the alterations in electric potential landscapes in the active devices. Furthermore, we carried out selective peel-off-and-rebuild experiments and depth-profiling analyses to pinpoint the critical degradation site and reveal the underlying microscopic mechanism. The results indicate that the operation-induced efficiency increase results from the degradation of electron-injection capability at the electron-transport layer/cathode interface, which in turn leads to gradually improved charge balance. Our work provides new insights into the degradation of red quantum-dot light-emitting diodes and has far-reaching implications for the design of charge-injection interfaces in solution-processed light-emitting diodes.

Recoverable Degradation Phenomena of Quantum Efficiency in Organic EL Devices

Anomalous Efficiency Elevation of Quantum-Dot Light-Emitting Diodes Induced by Operational Degradation.

Spontaneous And Reverse-Bias Induced Recovery Behavior In Organic Electroluminescent Diodes

Effect of Impurity Ions and Permanent Dipoles for Device Performance of Thin-Film Electroluminescent Diodes

Study on the Degradation Mechanism of Organic Light-Emitting Diodes (Oleds)

Relationship between charge transfer state electroluminescence and the degradation of organic photovoltaics

Voltage Shift Phenomena Introduced by Reverse-Bias Application in Multilayer Organic Light Emitting Diodes

Decoupling Degradation in Exciton Formation and Recombination During Lifetime Testing of Organic Light-Emitting Devices

Recoverable degradation and internal field forming process accompanied by the orientation of dipoles in organic light emitting diodes

Organic single-quantum-well electroluminescent device

Coulomb effect induced intrinsic degradation in OLED

Analyzing degradation effects of organic light-emitting diodes via transient optical and electrical measurements

Short-Term Degradation Behaviors of Light Emitting Diodes Made of Polyurethane Derivative with Large Permanent Dipoles on the Side Chain

Expanding the Hole Delocalization Range in Excited Molecules for Stable Organic Light-Emitting Diodes Employing Thermally Activated Delayed Fluorescence

Dependence of the Performance of the Organic Electroluminescent Devices Upon the Deposition Rate of Organic Thin Films

Probing polaron-induced exciton quenching in TADF based organic light-emitting diodes

Photodegradation of Organic Light-Emitting Devices Observed in Nitrogen-Filled Environment

Improvement of Current-Voltage Characteristics in Organic Light Emitting Diodes by Application of Reversed-Bias Voltage

Effect of Duty Ratio of Driving Voltage on the Forming Process in Aging of Organic Electroluminescent Device*

Giant Enhancement of External Quantum Efficiency in Near‐UV Organic Light‐Emitting Diodes Via Device Aging and Impedance Spectroscopy Analysis

Observation of reversible light degradation in organic photovoltaics induced by long-persistent radicals