Observation of reversible light degradation in organic photovoltaics induced by long-persistent radicals
Difei Zhang,Chao Liu,Kaicheng Zhang,Yanhua Jia,Wenkai Zhong,Weidong Qiu,Yuanfeng Li,Thomas Heumüller,Karen Forberich,Vincent M. Le Corre,Larry Lüer,Ning Li,Fei Huang,Christoph J. Brabec,Lei Ying,Li Yuanfeng,Thomas Heumueller,Vincent Marc Le Corre,Christoph J Brabec,Ying Lei
DOI: https://doi.org/10.1039/d3ee02540c
IF: 32.5
2023-09-17
Energy & Environmental Science
Abstract:With the rapid development of organic photovoltaics, device stability has become a crucial obstacle hindering their transition from laboratory to industrial applications. However, it remains still unclear how light differs from heat in driving trap formation and leads to device degradation. On the basis of the PTzBI-dF:Y6-BO system, it is observed that the post-thermal annealing on these high-performance organic solar cells can partially recover the light-induced burn-in losses. The recovery process is found to be correlated with a reversible charge extraction ability, reversible trap density of state, local charge carrier density, and charge accumulation. We propose in this work an innovative mechanism for light degradation in organic photovoltaic devices, which is triggered by the presence of light-induced long-persistent radicals. The findings offer deep insights into the light degradation of organic photovoltaics and a new perspective for improving device stability under long-term operation.
energy & fuels,chemistry, multidisciplinary,engineering, chemical,environmental sciences