Measurement of Piezoelectric Properties of PZT Films by Laser Doppler Technique

XU Xiao-hui,LU Jian,ZHU Long-yang,CHU Jia-ru
DOI: https://doi.org/10.3321/j.issn:1004-924x.2005.06.006
2005-01-01
Optics and Precision Engineering
Abstract:Laser Doppler technique was used to measure the piezoelectric properties of PZT((Pb(Zr,Ti)O_3)) thin films.The measurement of piezoelectric properties on commercial PZT bulk indicated that the introduction of lock-in technique,which offered excellent noise rejection,raised the displacement resolution up to picometer order.Then experiments were performed on PZT films derived by sol-gel method and Electrical Spray Deposition(ESD) method.The obtained results show that the piezoelectric coefficients(d_(33)) of the two films are 218.7 pC/N and 215.8 pC/N respectively,with 5 V dc bias,and the corresponding standard deviations are 12.7 and 28.6.
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