Design of the High-Precision Motion Platform for IC Testing

YANG Chao,HU Hong
DOI: https://doi.org/10.3969/j.issn.1002-2333.2006.05.033
2006-01-01
Abstract:In this paper, a high-Precision motion platform is designed for IC testing equipment-auto prober. The high-Precision motion platform is a key part of the prober. It can move in X?Y?Z?θ four directions. We have made a massive structure design for the platform and built an electric hardware system. And then we checked the transmission accuracy of the high-Precision motion platform. We do many experiments on different platform to analyze the positioning error in point to point motion control system. We can learn by experiment that the positioning accuracy and reliability can meet the demand of the wafer testing.
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