Cycle-Slip Detection Based on Empirical Mode Decomposition

HU Hong,GAO Jing-xiang,LIU Chao,WANG Jian
DOI: https://doi.org/10.3969/j.issn.1673-6338.2010.05.005
2010-01-01
Abstract:A new method for detecting cycle slips of the carrier phase measurements based on empirical mode decomposition(EMD)was proposed.The non-differential and double differential test volume were constructed by using carrier phase measurements of 1s and 30s sampling interval,and were detected based on EMD and wavelet.The experiments showed that the good result using EMD method was obtain if the cycle slip was with-in 10.Relative to the wavelet method,EMD did not need to select specific parameters,which avoided the shortcoming caused by selecting not appropriate wavelet base.Further more,endpoint effects of EMD method was analyzed and some draw backs of the EMD method in detecting cycle slip were also pointed out.
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