Analysis of High-Voltage Trench Bipolar Junction Diode (TBJD)

BD You,AQ Huang,JKO Sin
DOI: https://doi.org/10.1016/s0038-1101(99)00058-1
IF: 1.916
1999-01-01
Solid-State Electronics
Abstract:In this paper, a new high-voltage power diode structure, called the Trench Bipolar Junction Diode (TBJD) is proposed and analyzed with the aid of 2-D numerical simulations and experiments. For the first time, the feasibility to control the anode injection efficiency of a diode by the action of an integrated reverse active transistor is demonstrated experimentally. The base of the reverse active transistor is shielded by a deep p+ trench region to achieve superior dynamic characteristics over the conventional p-i-n diode structure. The dynamic parasitic transistor effect that limits the performance of the non-TBJD structures is shown to be suppressed effectively in the TBJD.
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