Structure and Dielectric Properties of (Bi2-xZnx)(Ti2-xNbx)O7 Ceramics

Chun-hao GAO,Tong-qing YANG,Qiong-na ZHENG,Xi YAO

DOI: https://doi.org/10.3969/j.issn.1004-2474.2009.04.036

2009-01-01

Abstract:The structure and dielectric properties of (Bi2-xZnx)(Ti2-xNbx)O7(0.4≤x≤1.0) ceramics were investigated. All samples sintered at 950～1 100 ℃ exhibit a single cubic pyrochlore structure according to X-ray diffraction analysis. Scanning electron microscope micrographs indicate that the grain size increases with the increase of x value. The dielectric properties tests at room temperature show that the dielectric constant at 1 MHz decreases from 218 to 122 with the increase of x value and the dielectric loss remains in the level of (1～4)×10-4. Dielectric temperature spectra reveal that all compositions show a typical dielectric relaxation behavior and the dielectric peak flattens with the increase of x value. The product of quality factor and frequency (Q×f ) is in the range of 112～158 GHz at the resonant frequency of 2～3 GHz by microwave characteristic tests.