Structural Characterization of Epitaxial Alpha-Derived Fesi2 on Si(111)

N JEDRECY,A WALDHAUER,M SAUVAGESIMKIN,R PINCHAUX,Y ZHENG
DOI: https://doi.org/10.1103/physrevb.49.4725
1994-01-01
Abstract:The tetragonal symmetry of epitaxial FeSi2 grains on Si(111) has been revealed for thin films (<40 angstrom) issued from two very different processes, which had in common a growth temperature of about 500-degrees-C. The structure has been investigated by out-of-plane x-ray diffraction and transmission electron microscopy. An atomic model is proposed derived from the high-temperature alpha phase.
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