Thickness-dependent Magnetization Reversal in CoZrNb Amorphous Films

X. W. Li,C. Song,J. Yang,F. Zeng,K. W. Geng,F. Pan
DOI: https://doi.org/10.1016/j.jmmm.2007.03.196
IF: 3.097
2007-01-01
Journal of Magnetism and Magnetic Materials
Abstract:Structure and magnetization of CoZrNb amorphous films prepared by DC magnetron sputtering have been studied as a function of film thickness (t), from 35 to 840nm. Using comprehensive characterization, we show that the CoZrNb amorphous films possess a single phase and no nanocrystalline can be detected. The magnetic measurements indicate that the magnetization reversal of CoZrNb films is strongly dependent on t. That is, the coercivity is abruptly reduced to be lower than 4Oe with t increasing from 35 to 105nm, and then gradually decreases to ∼0.2Oe as t increases. This coercivity transition versus t is accompanied by the strong magnetization reversal when t is larger than 105nm. The results reveal that CoZrNb amorphous films with comparatively large film thickness (>100nm) are suitable for sensors and anti-faked materials.
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