In Situ Observation of Phase Formation in a Cu—In—2Se Precursor Layer Using Micro-Raman Scattering Spectroscopy

Wang Deliang,Cao Yongsheng,Wan Lei
DOI: https://doi.org/10.1557/jmr.2009.0283
2009-01-01
Abstract:In situ observation of phase formations in Cu—In—2Se (atomic ratio) precursor layers was carried out using temperature-dependent micro-Raman scattering spectroscopy. Without the protection of a high Se vapor pressure, intermediate In—Se and Cu–Se selenides and CuAu-ordered CuInSe 2 (CIS) were easily formed in the amorphous precursor layer, which have atomic structures arranged in a way close to that of α-CIS. The binary selenides were transformed to the α-CIS by in-/out-diffusion of the mobile Cu and Se atoms/ions. The γ-CuSe and α-CIS began to form at a temperature as low as ∼170 °C.
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