An Optic-Fiber Interferometer for the Dynamic Characterization of Microstructures.

Chong Peng,Peiqiang Zhang
DOI: https://doi.org/10.1142/s0219878904000185
2004-01-01
Abstract:This article describes a measurement system designed to evaluate the dynamic characteristics of micromechanical structures. The system is based on Active Homodyne demodulation M-Z optic-fiber interferometer and can measure out-of-plane movement with a sensitivity of 0.1 nm. To validate the system, vibration measurements have been carried on a typical MEMS structure — the sensitive elements of a kind of uncooled IR imaging system, an array of micromachined bimaterial cantilevers (micron dimensions) — and the results are compared with the ones from FEM model analysis and another measurement method which can be known as spectrum plane optic filtering. The three results agree with each other. The first natural frequencies of the structures are determined from data obtained by vibrating the structures using a PZT excitation system. The mode shapes and modal damping will be carried out soon after a scanning system is completed.
What problem does this paper attempt to address?