Disk Resonators as Nonlinear Surface Impedance Measurement Tools

X. Z. Liu,Y. R. Li,B. W. Tao,A. Luo,J. Geerk

DOI: https://doi.org/10.1023/A:1011130523772

2001-01-01

Journal of Superconductivity

Abstract:The edge-current–free rotational symmetric disk resonator mode, TM 010 , was used as characterization tool for nonlinear surface impedance measurement of Y 1 Ba 2 Cu 3 O 7− x (YBCO) thin films. The microwave surface resistance of high quality epitaxial YBCO thin films as a function of frequencies and rf surface magnetic field H rf was measured using the circular disk resonator technique. Using this technique the properties degradation of the resonators by edge current crowding effect was avoided. The measured R s values are divided into three regions. In the low field region ( H rf ≤ H c1J ), R s is independent of H rf . In the intermediate H rf region, R s can be well fitted to the formula of R s ( H rf ) = a ( f ) + b ( f ) H rf 2 , and b ( f ) is proportional to f 2 . This form of microwave surface resistance quantitatively agrees with the modified coupled-grain model with the idea that the materials are composed of identical superconducting grains coupled together by identical intergranular regions that function as Josephson junctions. The experimental results show that the loss mechanisms are extrinsic properties resulting from defects in the films.