Abstract:This paper presents a novel method for measuring the microwave surface resistance distribution of high-temperature superconducting thin films by a dielectric resonator with a metal ring. After calibration, the effect of metal ring loss on measurement accuracy is negligible. The measurement resolution is determined by the internal diameter of the metal ring, which makes the design of the device more flexible. Therefore, measurement with high resolution and convenience can be achieved simultaneously by using a metal ring with proper size and operating at a relatively low frequency. A test device working at 32 GHz with TE 01(1 + δ ) mode was developed. Its resolution is a circular area with a diameter of 5 mm and an area of 19.6 mm 2 . The unloaded quality factor of the test device is more than 140,000, when it is loaded by the calibration cavity. The test device has a relative uncertainty of less than 6%, which complies with the uncertainty (20%) specified by the international standard for the microwave surface resistance measurement of high-temperature superconducting (HTS) thin film. The surface resistance distribution of a 2-in. YBCO/LAO/YBCO superconducting film sample was measured by this test device.

Characterizing the Distribution of Microwave Surface Resistance of HTS Film Based on Metal Ring