Abstract:In various fields of electronics, especially in telecommunication fields, microwave passive devices such as filters using high Tc superconductor (HTS) thin films are being developed and are undergoing on-site testing. Superconductor materials for applications of microwave resonators, filters, antenna and delay lines have the advantage of very low loss characteristics. Knowledge of this parameter is of primary importance for the development of a new material. For the typical reason of mechanics, various characterization technique have been developed to measure these properties, and each has its own advantages. For individual method, has some requires for the films, such as the dimension of the specimen under test. Sometime the really effective area is only a part of the whole area. In this article, we discussed the practical utilized area of a specimen of international standard on electronic characteristic measurements–surface resistance of superconductors at microwave frequencies. We designed the measurement apparatus for RS and measured the specimens. Both 2 inch specimen and 3 inch specimen are measured. We discussed the insertion loss for different diameter specimens. Some methods of measurements–surface resistance for different diameter specimens have been suggested. Also, we suggested the design procedures of dielectric resonator for the purpose of measuring high Tc superconductor (HTS) thin films surface resistance in different size samples.

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Hysteresis Measurement of Anomalous Microwave Surface Resistance in Superconducting Thin Films