Cluster characteristics of oxide submicron crystals formed by evaporation-deposition

WU Qing-lan,ZHANG Ji-zhong
DOI: https://doi.org/10.3969/j.issn.1000-6281.2006.06.006
2006-01-01
Abstract:Oxide deposits were produced in an evaporation-deposition system.Tin oxide submicron crystals were deposited on surfaces of silicon wafer,soda glass,and silica glass with different cooling rates,respectively.Various morphologies of the deposits were observed by scanning electron microscopy.A transient phenomenon from equilibrium growth to fractal growth was observed on the surface of silicon wafer cooled at a rate of 1 000℃/min.Cadmium oxide submicron crystals were deposited on the surface of silicon wafer,and displayed numerous self-organizing sunflower-like structures.The relationship between growth and morphology of oxide deposits was discussed.
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