Aggregation Patterns of Micron-Scale CdO Crystals at Interface of Vapour–solid State

P Qin,JZ Zhang,Z Diao

DOI: https://doi.org/10.1016/j.physb.2004.07.002

IF: 2.988

2004-01-01

Physica B Condensed Matter

Abstract:The elliptical, angular, and straight line CdO self-organization aggregates, as well as bush-like crystal clusters were observed on the surfaces of both N 〈100〉 and P 〈111〉 silicon wafers. The silicon wafers were heated at 580°C for 1h in an evaporation–deposition device. All of the self-organization aggregates deposited on respective ridgelines of the bush-like crystal clusters. The surface defects of both silicon substrates were investigated. The experimental results suggested that the CdO self-organization aggregates were related closely to the topographic condition of the bush-like crystal clusters, and not related directly to the surface defects of the silicon substrates. It testifies to a self-organized critical behaviour of the dynamical system during the vapour–solid phase transition.