Ti-rich and Cu-poor Grain-Boundary Layers of CaCu_3Ti_4O_12 Detected by X-Ray Photoelectron Spectroscopy

C. Wang,H. J. Zhang,P. M. He,G. H. Cao
DOI: https://doi.org/10.1063/1.2768006
IF: 4
2007-01-01
Applied Physics Letters
Abstract:Cleaved and polished surfaces of CaCu_3Ti_4O_12 ceramics have beeninvestigated by x-ray photoelectron spectroscopy (XPS) and energy dispersivex-ray spectroscopy (EDX), respectively. While EDX technique shows the identicalCaCu_3Ti_4O_12 stoichiometry for the two surfaces, XPS indicates thatthe cleaved surface with grain-boundary layers is remarkably Ti-rich andCu-poor. The core-level spectrum of Cu 2p unambiguously shows the existenceof monovalent copper only for the cleaved surface. Possible grain-boundarystructure and its formation are discussed.
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