Ti-rich and Cu-poor grain-boundary layers of CaCu$_3$Ti$_4$O$_{12}$ detected by x-ray photoelectron spectroscopy

C. Wang,H. J. Zhang,P. M. He,G. H. Cao
DOI: https://doi.org/10.48550/arXiv.0708.2301
2007-08-17
Materials Science
Abstract:Cleaved and polished surfaces of CaCu$_3$Ti$_4$O$_{12}$ ceramics have been investigated by x-ray photoelectron spectroscopy (XPS) and energy dispersive x-ray spectroscopy (EDX), respectively. While EDX technique shows the identical CaCu$_3$Ti$_4$O$_{12}$ stoichiometry for the two surfaces, XPS indicates that the cleaved surface with grain-boundary layers is remarkably Ti-rich and Cu-poor. The core-level spectrum of Cu 2$p$ unambiguously shows the existence of monovalent copper only for the cleaved surface. Possible grain-boundary structure and its formation are discussed.
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