SiC-Al interface crystallographic orientation relationship in a squeeze-cast SiCw/Al composite

l geng,ke wu,g k yao
DOI: https://doi.org/10.1016/1044-5803(95)80077-8
IF: 4.537
1995-01-01
Materials Characterization
Abstract:A SiC-Al interface in a squeeze-cast SiCw/6061 Al composite was studied by means of scanning transmission electron microscopy and high-resolution electron microscopy. A crystallographic orientation relationship was found at the SiC-Al interface and was identified as (011̄)sic//(001)Al, [211]sic//[100]Al. Based on crystallography theory, the formation mechanism of the orientation relationship was analyzed in detail. A semicoherent atom matching model of the SiC-Al interface was developed that can explain why the squeeze-cast SiCw/6061 Al composite has a high interface bond strength.
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