Measurement of induced pyroelectric coefficient using dynamic method:theory calculations and experiments

YAO Jin-cheng,WU Chuan-gui,PU Chao-guang,ZHANG Wan-li,LI Yan-rong,ZHU Jun
DOI: https://doi.org/10.3969/j.issn.1007-2276.2006.z5.037
2006-01-01
Infrared and Laser Engineering
Abstract:Theory calculations and experiments of dynamic method for induced pyroelectric coefficient were extensively described.For conventional pyroelectric——LiTaO_3 single crystal chips,the pyroelectric voltage was π/2 radians out of phase with the temperature wave,and the pyroelectric coefficient was 2.1×10~(-8) C cm~(-2) K~(-1),which suggest our measurement is accrue and credible.For conventional pyroelectric——(Ba_(0.65)Sr_(0.35)) TiO_3 thin films biased 1.5v voltage,the output voltage was combined a DC voltage with an AC voltage;the former was caused by leakage current through (Ba_(0.65)Sr_(0.35)) TiO_3 thin films,and the later was pyroelectric voltage.The pyroelectric voltage kept the same phase with temperature wave,and its amplitude was directly proportional to that of temperature wave. Theory calculations indicate that the change of dynamic measurements of pyroelectric materials,pyroelectric response to the same voltage and temperature signals from the phase change is the transformation of pyroelectric materials caused by the change of capacitance with temperature signal.
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