The Characteristics of Intimate AuInyAl1 − Yas Schottky Diodes: a Mismatch Dependence Study

SA CLARK,SP WILKS,RH WILLIAMS,JK LUO,F PEIRO,A PEREZRODRIGUEZ,A CORNET,JR MORANTE
DOI: https://doi.org/10.1016/0921-5107(94)90100-7
IF: 3.407
1994-01-01
Materials Science and Engineering B
Abstract:The electrical properties of intimate AuInyAl1 − yAs(100) Schottky diodes were studied as a function of InyAl1 − yAs alloy composition over a range (0.49 < y < 0.55), close to the lattice match y=0.52 with the InP(100) substrate. Highly ideal diodes exhibiting the highest reported Schottky barriers (0.82 eV), measured by the current-voltage (I–V) technique, were obtained on the InyAl1 − yAs epilayers most closely lattice matched to InP. Diodes formed on more mismatched InyAl1 − yAs epilayers were progressively less ideal and exhibited lower barrier heights. The origins of this departure from ideality were investigated by low temperature I–V measurements, indicating that tunnelling via structural defects in the depletion region may be of greater significance in the samples with greater mismatch. Furthermore, observations by transmission electron microscopy of InyAl1 − yAs layers formed under similar conditions revealed the presence of mismatch dependent, quasi-periodic fluctuations of alloy composition across the semiconductor surface. Using double-crystal X-ray diffraction, the amplitude of compositional modulation and the corresponding spatial fluctuations of the band gap were estimated, indicating that this may be a possible mechanism by which the effective barrier height is lowered as the InyAl1 − yAs/InP mismatch is increased.
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