Stress-Induced Frequency Shifts in Rotated Y-Cut Langasite Resonators with Electrodes Considered

Yun Jing,Jin Chen,Xun Gong,Jie Dunn
DOI: https://doi.org/10.1109/tuffc.2007.335
2007-01-01
Abstract:Stress-induced frequency shifts of the thickness-shear vibration of rotated Y-cut langasite resonators are studied with the electrode considered. The relationship between mass loading and force-frequency coefficients is explored for several kinds of electrode materials. Comparisons between Y-cut langasite and AT-cut quartz resonators are also presented.
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