Microstructure Dependence of Microwave Dielectric Characteristics in Ba6-3x Sm8+2x Ti18O54 (x = 2/3) Ceramics

N. Qin,X. M. Chen
DOI: https://doi.org/10.1007/s10832-007-9112-8
2007-01-01
Journal of Electroceramics
Abstract:Effects of microstructures on the microwave dielectric characteristics of Ba6-3x Sm8+2x Ti18O54 (x = 2/3) ceramics were investigated by controlling the sintering process and the annealing condition. The dielectric constant was sensitive to the porosity in ceramics, but insensitive to the annealing process. Q f value varied with both the annealing atmosphere and the sintering temperature, which indicates the strong reliance of dielectric loss on defects and grain boundaries. τ f value exhibited a complex dependence on the sintering temperature. The orientation of grains is responsible for the variation of τ f .
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