Abstract:We review recent advances in experimental methods for high spatial-resolution and high time-resolution thermometry, and the application of these and related methods for measurements of thermal transport in low-dimensional structures. Scanning thermal microscopy (SThM) achieves lateral resolutions of 50 nm and a measurement bandwidth of 100 kHz; SThM has been used to characterize differences in energy dissipation in single-wall and multi-wall carbon nanotubes. Picosecond thermoreflectance enables ultrahigh time-resolution in thermal diffusion experiments and characterization of heat flow across interfaces between materials; the thermal conductance G of interfaces between dissimilar materials spans a relatively small range, 20 <G <200 MW m(-2) K-1 near room temperature. Scanning thermoreflectance microscopy provides nanosecond time resolution and submicron lateral resolution needed for studies of heat transfer in microelectronic, opto-electronic and micromechanical systems. A fully-micromachined solid immersion lens has been demonstrated and achieves thermal-radiation imaging with lateral resolution at far below the diffraction limit, <2 mum. Microfabricated metal bridges using electrical resistance thermometry and joule heating give precise data for thermal conductivity of single crystal films, multilayer thin films, epitaxial superlattices, polycrystalline films, and interlayer dielectrics. The room temperature thermal conductivity of single crystal films of Si is strongly reduced for layer thickness below 100 nm. The through-thickness thermal conductivity of Si-Ge and GaAs-AlAs superlattices has recently been shown to be smaller than the conductivity of the corresponding alloy. The 3omega method has been recently extended to measurements of anisotropic conduction in polyimide and superlattices. Data for carbon nanotubes measured using micromachined and suspended heaters and thermometers indicate a conductivity near room temperature greater than diamond.

Thermal measurement associated with material failure using thermochromic coatings

A Novel Indirect Visualization Method for Studying the Melting Heat Transfer of Nano-Enhanced Phase Change Materials Using Thermochromic Liquid Crystal Thermography

Combined Experimental and DFT Study on High‐temperature Thermochromism of Co‐doped LaCrO3 Coating for Thermal Indicator

Infrared thermography for non-destructive evaluation of aluminum alloy LY12CZ under low cycle fatigue

Cover Picture: Thermal Conductivity Imaging of Thermal Barrier Coatings (adv. Eng. Mater. 7/2005)

Thermometry and Thermal Transport in Micro/Nanoscale Solid-State Devices and Structures

Thermal Conductivity Imaging of Thermal Barrier Coatings

Experimental Study of High Temperature Failure Behavior of Thermal Barrier Coating Based on 3D Digital Image Correlation of Single camera

Photothermal measurement of material properties for translucent thermal barrier coatings

Ultrathin Radiation Coating Enabling High Accuracy and High Resolution Real-Time Infrared Imaging of Thermal MEMS Devices

Numerical and Experimental Studies on the In-Situ Measurement of Thermal Conductivity of the Thermal Barrier Coating

Experimental Study on Debonding Defects Detection in Thermal Barrier Coating Structure Using Infrared Lock-in Thermographic Technique

Effect of Coating Thickness on the Calibration and Measurement Uncertainty of A Wide-Band Liquid Crystal Thermography

Simultaneous measurement of normal spectral emissivity and temperature of materials with low thermal conductivity

Thermal characterization of thin films: A chip-based approach for in-plane property analysis

Modulated Step-Heating Thermography for Coating Thickness Measurement

Use of a Thermographic Phosphor Fluorescence Imaging System for Simultaneous Measurement of Film Cooling Effectiveness and Heat Transfer Coefficient

Photothermal characterization of optical thin film coatings

High-temperature Optical Techniques Development and Its Application in Thermal Barrier Coatings

Measurement of Thermal Expansion Coefficient of Nonuniform Temperature Specimen

Thickness evaluations for thin coatings using laser scanning thermography