High-voltage Integrated Circuit Technology for Plasma Display Panel Drivers

洪慧,韩雁,叶晓伟
DOI: https://doi.org/10.3785/j.issn.1008-973x.2008.10.012
2008-01-01
Abstract:A new high-voltage Bipolar-CMOS-DMOS(BCD) technology compatible with 2.0 μm standard CMOS process was developed for plasma display panel(PDP) scan driver intergrated circuit(IC).The new field-oxide gate high-voltage pMOS and thin-oxide high-voltage nVDMOS were proposed and a new PDP scan driver IC was designed.The technique can reduce three masks,two ion-implantations and one oxidation to reduce process complexity and cost.Results showed that the breakdown voltages of HV-nVDMOS and HV-pMOS were both exceed 165 V,which achieved the system requirements.The rising and falling time of the PDP scan driver IC were 165 and 30 ns respectively with 90 V power supply and 200 pF capacitive load,which indicated a high driving capability.
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