Study of Resonance Force Microscopy System Based on Fabric Silicon Cantilever Detector

REN Ren,XU Jin,LIU Yujun,LIU Huiling,REN Danan
DOI: https://doi.org/10.16818/j.issn1001-5868.2010.02.022
2010-01-01
Abstract:Aiming at fabric silicon cantilever and spins study, the resonance force microscopy system was present. The silicon cantilever was fabriced to perfect the Q,K value. Moreover, combining with pulse sequence control and the spin rotate frame system, the experiments analyse the small resonance force and sensitivity. The results show that fabric silicon cantilever have high Q and soft K, the resonance slice and fiber interferometer gain the effective force oscillating, and greatly improved the spatial resolution. The system had advantage of MRI and AFM characteristics. In addition, the simulation indicates that it is powerful tool of magnetic resonance force technology and useful way to 3D atomic resolution microscopy imaging.
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