Amorphous TeO2/36°Y-X LiTaO3 Substrates for SAW Application

Xiao-li SHANG,Xun GONG,Jun XIONG,De ZHANG
DOI: https://doi.org/10.3969/j.issn.1004-2474.2009.01.002
2009-01-01
Abstract:The temperature coefficient of delay(TCD) of the amorphous TeO2 /36° Y-X LiTaO3 layered structure had been investigated.Other properties such as the mode of acoustic wave and the electromechanical coupling coefficient(k2) had also been calculated.It was found that the amorphous-TeO2 film with negative TCD was deposited on 36° rotated Y-X LiTaO3 which had a positive TCD.A zero TCD could be yielded while its film thickness was only 1/3 of the conventional SiO2 film.Furthermore,the 1st Love wave mode used in the structure was very pure and its k2 of around 8.61% was very high,with no obvious coupling with other modes.The structure was a new prospective material for SAW application.
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