Multilayer Beam Splitter Used in a Soft X-ray Mach-Zehnder Interferometer at Working Wavelength of 13.9 Nm

ZHANG Zhong,WANG Zhan-shan,WANG Hong-chang,WNAG Feng-li,WU Wen-juan,ZHANG Shu-min,QIN Shu-ji,CHEN Ling-yan
2006-01-01
High Power Laser and Particle Beams
Abstract:The soft X-ray Mach-Zehnder interferometer is an important tool in measuring the electron densities of laser-produced plasma near the critical surface.The design,fabrication and characterization of multilayer beam splitters at 13.9 nm for soft X-ray Mach-Zehnder interferometer are presented in the paper.The design of beam splitter is completed based on the standard of maximizing product of reflectivity and transmission of the beam splitter at 13.9 nm.The beam splitters,which are Mo/Si multilayer deposited on 10 mm×10 mm area,100 nm thickness Si_3N_4 membranes,are fabricated using the magnetron sputtering.A method based on extended He-Ne laser beam is developed to analyze the figure error of the beam splitters.The data measured by an optical profiler prove that the method based on visible light is effective to analyze the figure of the beam splitters.The rms figure error of a beam splitter reaches 1.757 nm in the center area 3.82 mm×3.46 mm and satisfies the need of soft X-ray interference experiment.The product of reflectivity and transmission measured by synchrotron radiation is near to 4%.The Mach-Zehnder interferometer at 13.9 nm based on the multilayer beam splitters is used in 13.9 nm soft X-ray laser interference experiment,in which a clear interferogram of C_8H_8 laser-produced plasma is got.
What problem does this paper attempt to address?