Influence of cationic stoichiometry of the bottom electrode La1-xSrxCoO3 on the microstructures of Pb(Ta0.05Zr0.48Ti0.47)O3 ferroelectric films using Pt/TiO2 conducting barrier

J. Yin,Q.L. Li,Z.G. Liu,M. Wang,Z.C. Wu,T. Yu
DOI: https://doi.org/10.1007/s003390050013
1999-01-01
Abstract:The heterostructures La1-xSrxCoO3/Pb(Ta0.05 Zr0.48Ti0.47)O3(PTZT)/La1-x SrxCoO3 have been deposited on SiO2/Si(001) substrates using Pt/TiO2 as conductive barrier by pulsed-laser deposition. La0.25Sr0.75CoO3(25/75) bottom electrodes with a pseudo-cubic perovskite structure favors (001)-textured growth of PTZT films. The ferroelectric capacitor LSCO(25/75)/PTZT/LSCO(25/75) remains about 96% of its polarization after 5×1010 switching cycles at an applied voltage of 5 V and a frequency of 500 kHz. The cross-section morphology of scanning electron microscopy and Rutherford backscattering spectra show that no obvious interdiffusion occurs across the interfaces.
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