Investigation of Long Trace Profiler for Aspherical Optics

LIU Bin,WANG Qiuping,FU Shaojun
2006-01-01
Laser & Optoelectronics Progress
Abstract:The characteristics of testing methods of measuring the large aspheric optical profile and their characteristics are summarized. The long trace profiler (LTP) is used for testing the surface slope error of synchrotron radiation (SR) optical elements. Its basic principle, seedtime, pivotal technique, error compensation, current situation and orientation of developing are expatiated especially. Thereafter the progress of the LPT of National Synchrotron Radiation Laboratory (NSRL) in Hefei is introduced.
What problem does this paper attempt to address?