A Simulation Platform for Amplitude Modulation Atomic Force Microscope

LI Xiao-feng,JIANG Sha-ru,ZHU Li-yuan,QIAN Jian-qiang,LI Yuan,LI Ying-zi
DOI: https://doi.org/10.3969/j.issn.1000-0712.2011.07.015
2011-01-01
Abstract:The model of amplitude modulation atomic force microscope(AM-AFM) probe dynamic process is obtained by the Euler-Bernoulli equation.Based on AM-AFM's negative feedback control system with a PID controller,a simulation platform for AM-AFM is established.The simulation results show that the platform can accurately reflect the dynamic characteristic when the probe approaches and scans the sample.In consequence,for students doing the AM-AFM experiment,the platform can be used as an effective tool,which helps the students to have a deeper understanding on the AM-AFM,as well as a tentative experience before practice.
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