A study on the degradation of GaAs/Ge solar cells irradiated by <200keV protons

Jian-Min Hu,Yi-Yong Wu,Zhongwei Zhang,De-Zhuang Yang,Shi-Yu He
DOI: https://doi.org/10.1016/j.nimb.2007.11.010
2008-01-01
Abstract:Damage effects in GaAs/Ge solar cells irradiated by <200keV protons were studied by measuring their electrical properties and spectral response together with SRIM simulations. Proton energies of 40, 70 and 170keV were chosen. Experimental results show that the short circuit current, open circuit voltage and maximum power decrease with increasing proton fluence. The degradation of the open circuit voltage is highest for 70keV irradiation and lowest for 40keV irradiation. The degradation of short circuit current decreases with increasing proton energy. According to SRIM simulations and spectral response analysis, the above changes in electrical properties are mainly related to damage in different regions of the solar cells.
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