Damage Critical Point of Lead-free Solder Joint Detected On-line Base on Resistance Strain

JIANG Li,PAN Yi,ZHOU Zuxi
DOI: https://doi.org/10.3969/j.issn.1001-3814.2011.05.047
2011-01-01
Abstract:Damage caused by creep is an important factor in the failure of solder joints.Experimental results indicate that during the creep there is a critical point time,before which the performance of solder joint shows a smooth linear change,while after which the performance dramatically degrades and fails before long.Therefore,it is of great significance for us to identify this point to judge the solder joint failure and predict the life of it.It is difficult to detect the damage critical point by traditional methods in real-time test.Studies show that there is linear relationship between the solder joint creep damage and its resistance changes,so the critical point can be detected by measuring the solder joint resistance.In this paper,an electronic testing system was developed by which the resistance of the solder joint under load can be measured and stored automatically.Then a forecasting model of the resistance was established by using double moving average method,the predicted value generated from which were compared with the measured value by which the damage critical point can be identified in real-time tests.This provides a new approach for the creep study of solder joint.
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