Abstract:The symmetry breaking that is induced by initial imperfection (e.g., geometry or material inhomogeneity and out-of-plane disturbance) is a necessary condition for film buckling. However, the effect of initial imperfection on the buckling behavior is still not clear cut. Herein, given an elastic substrate-free circular film subjected to in-plane compressive stress and arbitrary initial imperfection, evolution of the deflection morphology is numerically studied and theoretically analyzed. Specifically, a two-dimensional spatial spectrum analysis is adopted to acquire the deflection morphology's dominant wavelength, which is combined with the maximum absolute deflection to characterize the deflection patterns. Before the so-called critical instability, the film under compression is found to go through a transition stage. Overall, the deflection increment in this stage is negligible except approaching the critical state. However, the dominant wavelength is found to be continuously growing (or decreasing) rather than suddenly appears upon reaching the so-called critical state, and, interestingly, such growth is found to be independent of the intensity and pattern of the initial imperfection if the same initial dominant wavelength is guaranteed. In the discussion, for both the transition and buckling stages, evolution laws of the deflection amplitude and wavelength are established analytically and found to agree well with the numerical results. This research clearly presents the actual evolution process of wrinkling morphology from linear in-plane deformation with small stable deflection to out-of-plane instability with large deflection, which deepens the cognition of instability behavior of films and provides a basis for related applications such as high-precision mechanical characterization.

Surface Wrinkling of Nanostructured Thin Films on a Compliant Substrate

Surface Effects on the Mechanical Behavior of Buckled Thin Film

Surface effects on the wrinkles in a stiff thin film bonded to a compliant substrate

Spatially Configuring Wrinkle Pattern and Multiscale Surface Evolution with Structural Confinement

Wrinkling of Thin Films on a Microstructured Substrate

Instabilities of Thin Films on a Compliant Substrate: Direct Numerical Simulations from Surface Wrinkling to Global Buckling

Wrinkling Behavior of Variable Thickness Films Bonded to Elastic Substrates

Effect of Lateral Dimension on the Surface Wrinkling of a Thin Film on Compliant Substrate Induced by Differential Growth/swelling

Surface Wrinkling Patterns of Film–Substrate Systems with a Structured Interface

Buckling and Post-Buckling of A Stiff Film Resting on an Elastic Graded Substrate

Effects of Tension–compression Asymmetry on the Surface Wrinkling of Film–substrate Systems

Generation of Buckling and Wrinkling in Elastic Films: the Effect of Initial Imperfection.

Buckling of Elastic Thin Films on Compliant Substrates for Determination of Surface Parameters

Surface Effects On The Wrinkling Of Piezoelectric Films On Compliant Substrates

Wrinkle, fold, and ridge patterns of thin films attached to a compliant substrate: Direct numerical simulations involving plastic yielding

Controlling the Surface Buckling Wrinkles by Patterning the Material System of Hard-Nano-film/soft-matter-substrate

Surface Wrinkling of Anisotropic Films Bonded on a Compliant Substrate

Mechanism of Three-Dimensional Surface Wrinkle Manipulation on a Compliant Substrate

Finite Deformation Mechanics In Buckled Thin Films On Compliant Supports

Mechanism of Surface Wrinkle Modulation for a Stiff Film on Compliant Substrate

Mechanism for Controlling Buckling Wrinkles by Curved Cracks on Hard-Nano-film/soft-matter-substrate