Abstract:In these years, with the continuous development of 14nm and 7nm chip processes and the increasing popularity of computers, cell phones, and smart homes, the growing market of electronic products and ultra-fine research for the reliability of the chip requirements gradually increased. The method of reducing power consumption in the new context of new technology is called the chip field die-cut concern. This paper mainly summarizes two aspects of power consumption sources and methods to reduce power consumption, to provide a reference basis for future research directions: First, the major sources of power consumption are static power consumption and dynamic power consumption. The primary sources of static power consumption are sub-threshold leakage and gate leakage current. This paper also mentions some other leakage currents, such as reverse bias PN junction current and induced leakage current, which can be more carefully considered when exploring methods to reduce power consumption. A more comprehensive consideration when exploring ways to reduce power consumption. Dynamic power consumption is mainly divided into Switching power and Internal power and short-circuit power. Then we summarize the existing methods which can reduce power consumption: Clock gating (including Clock gating without a latch and Clock gating with a latch), Dynamic voltage and frequency scaling, multi-supply and multi-voltage technology, Power gating and multi-threshold voltage. These methods are from a proprietary perspective to reduce power consumption.

Techniques Of Power-Gating To Kill Sub-Threshold Leakage

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Gate Replacement Techniques For Simultaneous Leakage And Aging Optimization

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Integrating Operation Scheduling and Binding for Functional Unit Power-Gating in High-Level Synthesis

Leakage Power and Circuit Aging Cooptimization by Gate Replacement Techniques

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Power-gating-aware Scheduling with Effective Hardware Resources Optimization.

Study on leakage power estimation and reduction methodology of CMOS circuit

Statistical analysis of full-chip leakage power for 65nm CMOS node and beyond

Statistical Analysis of Full-Chip Leakage Power Considering Junction Tunneling Leakage

Leakage Power Optimization for Clock Network Using Dual-Vth Technology

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A Power Gating Scheme for Ground Bounce Reduction During Mode Transition

FSM Decomposition for Power Gating Design Automation in Sequential Circuits

Ultra-low-power Integrated Circuit Technology

Ultra Low Power Circuits Design Based on III-V Group Heterojunction Tunnel Field Effect Transistor

A Method for Gate-level Power Analysis of SoC