Abstract:Reliability has become an increasingly important concern for SRAM-based field programmable gate arrays (FPGAs). Targeting SEU (single event upset) in SRAM-based FPGAs, this article first develops an SEU evaluation framework that can quantify the failure sensitivity for each configuration bit during design time. This framework considers detailed fault behavior and logic masking on a post-layout FPGA application and performs logic simulation on various circuit elements for fault evaluation. Applying this framework on MCNC benchmark circuits, we first characterize SEUs with respect to different FPGA circuits and architectures, for example, bidirectional routing and unidirectional routing. We show that in both routing architectures, interconnects not only contribute to the lion's share of the SEU-induced functional failures, but also present higher failure rates per configuration bits than LUTs. Particularly, local interconnect multiplexers in logic blocks have the highest failure rate per configuration bit. Then, we evaluate three recently proposed SEU mitigation algorithms, IPD, IPF, and IPV, which are all logic resynthesis-based with little or no overhead on placement and routing. Different fault mitigating capabilities at the chip level are revealed, and it demonstrates that algorithms with explicit consideration for interconnect significantly mitigate the SEU at the chip level, for example, IPV achieves 61% failure rate reduction on average against IPF with about 15%. In addition, the combination of the three algorithms delivers over 70% failure rate reduction on average at the chip level. The experiments also reveal that in order to improve fault tolerance at the chip level, it is necessary for future fault mitigation algorithms to concern not only LUT or interconnect faults, but also their interactions. We envision that our framework can be used to cast more useful insights for more robust FPGA circuits, architectures, and better synthesis algorithms.

A Physical Design Approach for Mitigating Soft Errors in SRAM-based FPGAs

Soft Error Mitigation and Recovery of SRAM-based FPGAs Using Brain-Inspired Hybrid-Grained Scrubbing Mechanism.

Design and Verification of Multiple SEU Mitigated Circuits on SRAM-based FPGA System

A Method for Assessing Soft Error Rate Based on the Resource Configuration of Netlist-Level Circuit Topology in SRAM-based FPGAs

CRC Circuit Design for SRAM-Based FPGA Configuration Bit Correction

A MUX Structure Design for Soft Error Mitigation in FPGA

SEU Fault Evaluation and Characteristics for SRAM-based FPGA Architectures and Synthesis Algorithms

IPF: In-Place X-Filling to Mitigate Soft Errors in SRAM-Based FPGAs.

Exploiting Free LUT Entries to Mitigate Soft Errors in SRAM-based FPGAs

A Design Approach of Mitigating Single Event Upset for On-Chip Memory Based on SoC FPGA

Radiation-tolerant routing algorithm design for FPGAs

Fault modeling and characteristics of SRAM-based FPGAs (abstract only).

A Kind of Low-cost Non-intrusive Autonomous Fault Emulation System

Zero-Hardened SRAM Cells to Improve Soft Error Tolerance in FPGA

SEU-tolerant design for SRAM based FPGA on spacecraft

Single event upset mitigation for FDP2008

A Rapid Scrubbing Technique for SEU Mitigation on SRAM-based FPGAs

SRAM FPGAs Single Event Upsets Detection Method Based on Selective Readback

A Review on Soft Error Correcting Techniques of Aerospace-Grade Static RAM-Based Field-Programmable Gate Arrays

SRAM-Based FPGA SEU Fault Propagation Model

A Soft-Error Mitigation Approach Using Pulse Quenching Enhancement at Detailed Placement for Combinational Circuits