Abstract:FPGAs have been shown to operate reliably within harsh radiation environments by employing single-event upset (SEU) mitigation techniques such as configuration scrubbing, triple-modular redundancy, error correction coding, and radiation aware implementation techniques. The effectiveness of these techniques, however, is limited when using complex system-level designs that employ complex I/O interfaces with single-point failures. In previous work, a complex SoC system running Linux applied several of these techniques only to obtain an improvement of 14 in Mean Time to Failure (MTTF). A detailed post-radiation fault analysis found that the limitations in reliability were due to the DDR interface, the global clock network, and interconnect. This paper applied a number of design-specific SEU mitigation techniques to address the limitations in reliability of this design. These changes include triplicating the global clock, optimizing the placement of the reduction output voters and input flip-flops, and employing a mapping technique called "striping". The application of these techniques improved MTTF of the mitigated design by a factor of 1.54 and thus provides a 22.8X MTTF improvement over the unmitigated design. A post-radiation fault analysis using BFAT was also performed to find the remaining design vulnerabilities.

Radiation-tolerant routing algorithm design for FPGAs

Radioresistance Placement Algorithm for FPGA Based on SRAM Structure

Design and Verification of Multiple SEU Mitigated Circuits on SRAM-based FPGA System

CRC Circuit Design for SRAM-Based FPGA Configuration Bit Correction

Improving Fault Tolerance for FPGA SoCs Through Post Radiation Design Analysis

A New Approach To Detect-Mitigate-Correct Radiation-Induced Faults For Sram-Based Fpgas In Aerospace Application

The Research of FPGA Reliability Based on Redundancy Methods

IPF: In-Place X-Filling to Mitigate Soft Errors in SRAM-Based FPGAs.

A New Analytical Approach to Evaluate the Radiation Sensitivity of Circuits Implemented on SRAM-Based FPGAs

SEU sensitivity and large spacing TMR efficiency of Kintex-7 and Virtex-7 FPGAs

A Novel High-Density Single-Event Upset Hardened Configurable SRAM Applied to FPGA

Fault modeling and characteristics of SRAM-based FPGAs (abstract only).

Radiation Environment-Constrained FPGA Reinforcement Technology and Reliability Research Utilizing Error Control Coding

Design and Implementation of SEU Hard Core Detection Circuit

SRAM-Based FPGA SEU Fault Propagation Model

Single event upset mitigation for FDP2008

SEE Sensitivity Evaluation for Commercial 16 nm SRAM-FPGA

Design and Implementation of a Delay-Optimized Universal Programmable Routing Circuit for FPGAs

Research of Efficient Utilization Routing Algorithm for Current Fpga

A high utilization rate routing algorithm for modern FPGA

Balance of memory footprint and runtime for high-density routing in large-scale FPGAs