Abstract:With the development of satellite communications, on-board processing (OBP) obtains more and more attentions due to the increased efficiency and performance. However, the large amounts of digital circuits in the OBP transponders are sensitive to the high-energy particles in space radiation environments, which may cause various kinds of single event effect. Among these effects, single event upset (SEU) is the major potential reason for the instability of the satellite communication systems. Triple modular redundancy (TMR) is a classical and effective method for mitigating the SEU in digital circuits. However, since three identical logic modules and a voting circuit are needed in TMR, the overhead is so high that the scheme may not be applicable on the on-board digital processing platform with very limited area and power resources. Therefore, how to design a more cost-effective fault-tolerant method becomes a critical issue. Considering that FIR-like processing is frequently used on OBP platform, in this article, a dual modules (DM) plus checking module based on residue code (DM-CRC) architecture for SEU-tolerant FIR design is proposed. Although this architecture reduces the area overhead dramatically, we find that the fault missing rate is still high if single-sample checking (SSC) is used. To solve this problem, a Multi-sample checking DM-CRC (MSC-DM-CRC) is further proposed. Our analysis shows that the MSC-DM-CRC scheme can make the fault missing rate small enough without reducing the actual throughput. By simulations it is shown that, when the modulus for CRC is 7 and the number of samples for MSC is 4, the reduction of area overhead relative to TMR is over 20% and the fault missing rate is as low as 0.05%.

Design and Implementation of SEU Hard Core Detection Circuit

CRC Circuit Design for SRAM-Based FPGA Configuration Bit Correction

Design and Verification of Multiple SEU Mitigated Circuits on SRAM-based FPGA System

Test and Inquiry of FPGA SEU-Hardening by TMR

Radiation Environment-Constrained FPGA Reinforcement Technology and Reliability Research Utilizing Error Control Coding

Fault modeling and characteristics of SRAM-based FPGAs (abstract only).

IPF: In-Place X-Filling to Mitigate Soft Errors in SRAM-Based FPGAs.

Radiation-tolerant routing algorithm design for FPGAs

A Novel High-Density Single-Event Upset Hardened Configurable SRAM Applied to FPGA

A New Approach To Detect-Mitigate-Correct Radiation-Induced Faults For Sram-Based Fpgas In Aerospace Application

Evaluation of SEU Sensitivity in Hardened FPGA on Layout-based Sensitive Volume Method

Single event upset mitigation for FDP2008

The Research of FPGA Reliability Based on Redundancy Methods

An Accurate Fault Location Method Based on Configuration Bitstream Analysis

Soft Error Mitigation for Deep Convolution Neural Network on FPGA Accelerators.

Study of an Automated Precise SEU Fault Injection Technique

Verification and Automatic Error Injection Method of SEM IP Core for SRAM-Based FPGAs

Implementation of Highly Reliable Convolutional Neural Network with Low Overhead on Field-Programmable Gate Array

New Insights into the Impact of SEUs in FPGA CRAMs

Improving Fault Tolerance for FPGA SoCs Through Post Radiation Design Analysis

Residue code based low cost SEU-tolerant fir filter design for OBP satellite communication systems