Abstract:Placement is a critical step in the physical design for digital application specific integrated circuits (ASICs), as it can directly affect the design qualities such as wirelength and timing. For many domain specific designs, the demands for high performance parallel computing result in repetitive hardware instances, such as the processing elements in the neural network accelerators. As these instances can dominate the area of the designs, the runtime of the complete design’s placement can be traded for optimizing and reusing one instance’s placement to achieve higher quality. Therefore, this work proposes a mixed integer programming (MIP)-based placement refinement algorithm for the repetitive instances. By efficiently modeling the rectilinear steiner tree wirelength, the placement can be precisely refined for better quality. Besides, the MIP formulations for timing-driven placement are proposed. A theoretical proof is then provided to show the correctness of the proposed wirelength model. For the instances in various popular fields, the experiments show that given the placement from the commercial placers, the proposed algorithm can perform further placement refinement to reduce 3.76%/3.64% detailed routing wirelength and 1.68%/2.42% critical path delay under wirelength/timing-driven mode, respectively, and also outperforms the state-of-the-art previous work.

Research of placement of test structure in addressable test chip

A Fully Automated Large-Scale Addressable Test Chip Design with High Reliability

Design and implementation of a PCB testing system

Design and application of test structure array based on modular unit

An improved method for test chip design

A New Timing-Driven Placement Algorithm Based on Table-Lookup Delay Model

Study of strip layout in progressive die CAD for IC lead frame based on optimizing rules

A novel layout automation flow to facilitate test chip design for standard cell characterization

Addressable Test-Chip Compiler for Test Chip Design Automation and Transistor/yield Characterization

A Novel Algorithm for Placement of Mixed Macro Block and Standard Cell Designs

Design And Automatic Generation Of Area-Efficient Ring Oscillator Based Addressable Test Chips

Chip Layer Assignment Method for Analytical Placement of 3D ICs

Testing Structure for Detection of Poly Stringer Defects in CMOS ICs

Fame: A Fast Detailed Placement Algorithm For Standard-Cell Layout Based On Mixed Mincut And Enumeration

Better Initial Placement Algorithm for Large-Scale Mixed-Mode Detailed Placement

A Multilevel Analytical Placement for 3D ICs

Mixed Integer Programming based Placement Refinement by RSMT Model with Movable Pins

VLSI Block Placement Using Less Flexibility First Principles

An Effective Detailed Placement Algorithm for Large-Scale Mix-Mode IC Design

VLSI Placement with Pre-Placed Modules Based on Less Flexibility First Principles

An Offline Placement Algorithm for Reconfigurable Computing Systems