A new temperature stable microwave dielectric with low-firing temperature in Bi2MoO6–TiO2 system

Li-Xia Pang,Hong Wang,Di Zhou,Xi Yao
DOI: https://doi.org/10.1016/j.jallcom.2009.12.168
IF: 6.2
2010-01-01
Journal of Alloys and Compounds
Abstract:A new temperature stable microwave dielectric with low-firing temperature in xBi(2)MoO(6)-(1 - x)TiO2 system was prepared by conventional solid state reaction method. The crystalline phases, sintering behavior, microwave dielectric properties of xBi(2)MoO(6)-(1 - x)TiO2 ceramics were studied. All the xBi(2)MoO(6)-(1 - x)TiO2 ceramics could be well sintered at 850 degrees C for 3 h. X-ray diffraction analysis showed that tetragonal rutile phase and monoclinic Bi2MoO6 phase coexisted in the ceramic. The permittivity epsilon(r) changed from 77.5 to 33.5 and the temperature coefficient of resonant frequency tau(f) value shifted from +348.1 to -37.8 ppm/degrees C as the x value increased from 0.06 to 0.65. The temperature stable microwave dielectric ceramic was obtained when x = 0.57 in the xBi(2)MoO(6)-(1 - x)TiO2 system, and it showed excellent dielectric properties of epsilon(r) = 36.7, Qf = 16,800 GHz and tau(f) = 0 ppm/degrees C. Crown Copyright (C) 2010 Published by Elsevier B.V. All rights reserved.
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