Analysis of Defects Formation and Mobility During Ion Irradiation by Coherent Precipitates

ZC Li,H Abe,N Sekimura
DOI: https://doi.org/10.2320/matertrans.47.259
2006-01-01
MATERIALS TRANSACTIONS
Abstract:Transmission electron microscopy observation of cross-sectional specimens prepared by focused ion beam milling method have beenappliedtostudythedeepradiationdamageanddepthprofileofpointdefectsgeneratedduringionirradiationinCu–1mass%Coalloyspecimensbymeansofcoherentprecipitates.Thespecimenswereirradiatedatatemperaturerangeof250to500 Cby4and0.6MeVselfCuionstoadoseof 0.3dpa. The damage range has been observed at depths well beyond that expected from ion damage range calculations.(Received October 26, 2005; Accepted December 21, 2005; Published February 15, 2006)Keywords: ion irradiation, point defect, depth profile
What problem does this paper attempt to address?