Microwave Reflectometry for Plasma Density Profile Measurements on Hl-2a Tokamak

Weiwen Xiao,Zetian Liu,Xuantong Ding,Zhongbing Shi,Vladimir Zhuravlev
DOI: https://doi.org/10.1088/1009-0630/8/2/02
2006-01-01
Abstract:A modulated microwave reflectometry has been successfully developed on HL-2A, which can be used to measure the plasma density profile with time-delay method. This microwave reflectometry has two frequency ranges (26.5 to 40 GHz and 40 to 60 GHz) and it is suitable for measuring the plasma density ranging from 0.8 × 1013 cm−3 to 4.5 × 1013 cm−3. The temporal resolution is 1 ms and the spatial resolution is about 1 cm. This paper will present the basic principle of the microwave reflectometry, parameters calibration of the equipment and the experimental results on HL-2A tokamak.
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