Deposition of Ni, Ag, and Pt-based Al-doped ZnO Double Films for the Transparent Conductive Electrodes by RF Magnetron Sputtering

Weifeng Yang,Zhengyun Wu,Zhuguang Liu,Lingmin Kong
DOI: https://doi.org/10.1016/j.apsusc.2010.06.007
IF: 6.7
2010-01-01
Applied Surface Science
Abstract:Ni, Ag, and Pt-based Al-doped ZnO (AZO) films have been deposited as transparent conductivity layers on quartz by RF magnetron sputtering and characterized by X-ray diffraction, Hall measurement, optical transmission spectroscopy, scanning electron microscopy (SEM). The deposition of thicker metal layer in double layers resulted in lowering the effective electrical resistivity with a slight reduction of their optical transmittance. A film consisting of AZO (250nm)/Ni (2nm) double structure, exhibits a sheet resistance of 21.0Ω/sq, a high transmittance of 76.5%, and characterize good adhesion to substrate. These results make the satisfactory for GaN-based light-emitting diodes (LEDs) and solar cells with metal-based AZO double films as current spread layers.
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