Abstract:The limits of chip technology are constantly being pushed with the continuous development of integrated circuit manufacturing processes and equipment. Currently, chips contain several billion, and even tens of billions, of transistors, making chip testing increasingly challenging. The verification of very large-scale integrated circuits (VLSI) requires testing on specialized automatic test equipment (ATE), but their cost and size significantly limit their applicability. The current FPGA-based ATE is limited in its scalability and support for few test channels and short test vector lengths. As a result, it is only suitable for testing specific chips in small-scale circuits and cannot be used to test VLSI. This paper proposes a low-cost hardware and software solution for testing digital integrated circuits based on design for testability (DFT) on chips, which enables the functional and performance test of the chip. The solution proposed can effectively use the resources within the FPGA to provide additional test channels. Furthermore, the round-robin data transmission mode can also support test vectors of any length and it can satisfy different types of chip test projects through the dynamic configuration of each test channel. The experiment successfully tested a digital signal processor (DSP) chip with 72 scan test pins (theoretically supporting 160 test pins). Compared to our previous work, the work in this paper increases the number of test channels by four times while reducing resource utilization per channel by 37.5%, demonstrating good scalability and versatility.

Pipelined Parallel Test Structure for Mixed-Signal SoCs.

Research on Test Structure of Analog Cores in Mixed-Signal SoCs

Design of Hardware Pipelining Processor

A novel research on mixed-signal SoC self-hold analog IP core test wrapper design

Test Planning for Mixed-Signal SOCs with Wrapped Analog Cores

Joint testing scheme on mixed SoC

A Case Study of Testing Strategy for AI SoC

Low Power Pipelined A/D Converter in 0.6 Μm Technology

Software- Based Self-Testing Methodology for Embedded Processor Cores

Design of Mixed-Signal Circuit for Testability

Design for HW/SW Co-Testing Based on FPGA

Simultaneous Accelerator Parallelization and Point-to-point Interconnect Insertion for Bus-Based Embedded SoCs

A 10-bit 20-Msample/s 49mW CMOS pipelined A/D converter

A scalable test mechanism and its optimization for test access to embedded cores

A Microprocessor Based SOC Built-In Test Scheme

Advanced Low Pin Count Test Architecture for Efficient Multi-Site Testing

FATE: A Flexible FPGA-Based Automatic Test Equipment for Digital ICs

SOC Testing Methodology and Practice

Concurrent Core Test for SOC Using Shared Test Set and Scan Chain Disable

Optimal functional unit assignment and voltage selection for pipelined MPSoC with guaranteed probability on time performance

Combined Self-Test of Analog Portion and ADCs in Integrated Mixed-Signal Circuits