Abstract:A study has been made of the electrical behaviour of In-doped metal organic vapour phase epitaxy (MOVPE) layers of Hg(1-x)Cd(x)Te grown by the interdiffused multilayer process (imp) in order to establish the factors needed to obtain uniform extrinsic n-type layers with high electrical activity and mobility. Layers with x between 0.2 and 0.3 were grown on (100) CdTe and CdTeSe at 360-degrees-C using di-isopropyltelluride (DIPT) and doped with trimethylindium (TMIn) in two ways, depending on In concentration, [In]. For [In] > 1 x 10(17) cm-3 layers were doped with TMIn on the CdTe part of the imp cycle while for [In] in the range 1 X 10(15) to l X 10(17) cm-3 the TMIn memory of the growth system was used, resulting in doping on the HgTe part of the imp cycle because of a greater efficiency of incorporation. In profiles, which were determined by secondary-ion mass spectrometry (SIMS), are shown to depend on doping process due to TMIn partial pressure variations from adsorption effects. The layers, which were capped with CdTe to prevent inadvertent post-growth annealing from affecting the electrical activity of the In, were p type when undoped. On doping, as-grown layers become n type at 77 K at [In] approximately 1 x 10(16) cm-3 due to the concentration of donors exceeding the background concentration of Hg acceptor vacancies. The percentage of In electrically active is 33 % at [In] less-than-or-equal-to 2 x 10(18) cm-3 and 15-20 % at higher [In]. The 77 K Hall mobilities of layers, both p and n type, are low when [In] > 1 x 10(16) cm-3, probably because of high levels of compensation. Low temperature annealing to remove Hg vacancies, both ex situ and in situ, significantly improves the electrical properties. Electrical activity of the In increases to 100 % over the [In] range 1 x 10(15) to 2 x 10(18) cm-3 and to 40 % at higher concentrations. 77 K Hall mobility of the n-type layers increases and shows a dependence on carrier concentration and x consistent with lightly compensated material. Results are in agreement with In doping introducing autocompensating centres which anneal out on a low-temperature Hg-rich anneal.

Etch Pits Observation And In Distribution In Mercury Indium Telluride Single Crystals

Defect Characterization And Composition Distributions Of Mercury Indium Telluride Single Crystals

Growth, Structure and Electrical Properties of Mercury Indium Telluride Single Crystals

Growth and Characterization of Mercury Indium Telluride Single Crystals

Hg(3-3x)In2xTe3: A Novel Semiconductor Material for Near Infrared Photovoltaic Detectors

Study on the growth and thermal characteristics of mercury indium telluride crystals

Preparation and thermal stability of mercury indium telluride single crystals

Preparation and Properties of a Novel Near Infrared Photovoltaic Detector Single-Crystal Material

Synthesis and Crystal Growth of Mercury Indium Telluride

Defect Etching of Near-infrared Semiconductor HgInTe

High Temperature X-Ray Diffraction Study on Phase Transformation and Lattice Thermal Expansion of Mercury Indium Telluride Crystals

Single-crystal Growth of Mercury Indium Telluride (MIT) by Vertical Bridgman Method (VB)

A Junction-Level Optoelectronic Characterization of Etching-Induced Damage for Third-Generation HgCdTe Infrared Focal-Plane Array Photodetectors

Study of Thermal Expansion of Mercury Indium Telluride Crystals by XRD Technique

Native point defects in HgCdTe infrared detector material: Identifying deep centers from first principles

Intrinsic defects and mid-gap states in quasi-one-dimensional Indium Telluride

Discrimination of Dislocations in 4H-Sic by Inclination Angles of Molten-Alkali Etched Pits

Crystal Growth of Mercury Indium Telluride

Characteristics of Doped Indium in Cd0.9Zn0.1Te Grown by the Bridgman Method

Observation of Thermal-Misfit Strain Relaxation in A Pbte Semiconductor Grown on Cd0.96zn0.04te(111)

Control of the Electrical Properties of In-doped HgCdTe Grown by MOVPE for IR Detector Applications